01:10

IONMASTER | Features of the SIMS Unit

01:03

RAITH NEW DIMENSIONS

02:24

IVAM visits RAITH: Interview with CEO Dr. Michael Steigerwald

03:56

How the University of Osnabrück benefits from the flexibility of PICOMASTER | Customer Reference

01:58

Vision & Mission Customers Perspective II

03:51

Customer Reference: University of Konstanz

01:34

3D Ion microscopy for tomography and sample reconstruction

00:43

VELION: FIB-SEM beyond limits

02:03

Customer Reference: UCSD

01:44

About Raith

05:21

Vision & Mission Statement

02:13

Vision & Mission Customers Perspective

02:01

Raith Vision & Mission

01:57

PICOMASTER Resolution | Webinar Snippet

02:46

PICOMASTER200 Software Overview | Webinar Snippet

01:22

Clean Room Insight // Raith Headquarter

01:46

PICOMASTER200 system overview | Webinar Snippet

04:05

Customer Reference: UC Berkeley

03:31

Customer Reference: Stanford University

01:18

Working at Raith as a Service Engineer

01:31

Working at Raith as a Mechatronics Technician

01:17

Working at Raith as an industrial mechanic

00:49

The FIB-SEM VELION and its applications

06:26

A talk: Integration and future of 4PICO and Raith

01:15

EBL at the push of a button

06:39

Tell us your Story - Francisco Freire Fernández

01:15

Performance that matters

00:20

New tutorials for free! Get answers to the most frequently asked questions, any time and anywhere.

02:11

Professionals & Managers

00:36

Working at Raith

02:39

Students & Graduates

00:50

Something new.

04:37

EBPG Demo Lab Tour

00:15

EBL webinar series

00:21

Save your spot! - VELION webinar series

00:59

Safe. Together.

03:01

Raith VELION installation at WWU Münster

03:16

Electron Beam Lithography

00:56

This is Raith

00:33

Sketch and Peel for fast ion beam patterning

03:18

Shaping the Future of Nanoscience - New Specs for the EBPG

02:48

Ausbildung bei Raith

00:47

Raith Micrograph Award 2018

00:54

Raith Corporate Design Relaunch 2014

00:31

Raith Image Video 2014

01:05

Raith nanoBunny

00:47

Introducing the new VELION FIB-SEM on the DPG spring meeting

01:48

Modulated-Beam-Moving-Stage (MBMS) - periodic patterning without stitching errors

02:18

Fixed-Beam-Moving-Stage (FBMS) - unique continuous writing mode for EBL and FIB

00:46

High precision laser interferometer stage by Raith

03:15

Accurate waveguide stitching with Raith's Laser Interferometer Stage

01:17

Raith nanoClaus

03:55

Raith webinar Large Area Imaging - part1 introduction

16:12

Raith webinar Large Area Imaging - part2 Raith instruments and introduction CHIPSCANNER

11:00

Raith webinar Large Area Imaging - part3 Semiconductor Reverse Engineering

16:47

Raith webinar Large Area Imaging - part4 Connectomics (reverse engineering of neuronal circuits)

03:21

Raith webinar Large Area Imaging - part5 Summary and Outlook

11:11

Raith webinar Large Area Imaging - part6 Q&A session

00:32

traxx / FBMS Technology

00:31

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