MPI AST - SiPH
6 videos • 210 views • by MPI AST Silicon Photonics On-Wafer Test MPI Definition The requirement to increase bandwidth in all phases of wire and/or wireless communications combined with an increase in data center speed is driving the communication world away from copper interconnects and towards Silicon Photonics. This evolving technology uses a combination of fiber optics, optical wave guides, integrated optics, optical amplifiers, laser frequency light waves, and photo detectors to carry far more data than traditional copper conductors, to support faster data transfer rates between data communication centers. There are many new processes and capabilities which require to perform variety of non-conventional on-wafer measurements, such as pure parametric optical: Insertion Loss (IL), polarization dependent loss (PDL) measurements, Optical/Electrical S-Parameters, E-E, E-O, O-E, O-O, optical eye, jitter, transmitter and dispersion eye closure (TDEC), and e.g. on the receiver side bit-error-rate (BER) testing. For more information please visit https://www.mpi-corporation.com/ast/a...